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Dielectric spectra and Vogel-Fulcher scaling in Pb(In0.5Nb0.5)O3 relaxor ferroelectric

Identifieur interne : 000E04 ( Russie/Analysis ); précédent : 000E03; suivant : 000E05

Dielectric spectra and Vogel-Fulcher scaling in Pb(In0.5Nb0.5)O3 relaxor ferroelectric

Auteurs : RBID : Pascal:99-0358492

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English descriptors

Abstract

Dielectric dispersion in disordered Pb(In0.5Nb0.5)O3 crystals was studied. Two dispersion regions were found at 103-105 Hz and 108-109 Hz at room temperature. The low-frequency relaxation process, which has a very wide distribution of relaxation times, shifts to higher frequency (up to about 109 Hz) and becomes narrower in frequency with increasing temperature. It is this relaxation process that is responsible for the temperature shift of the diffused ε(T) maximum with increasing frequency. At low frequencies (f < 106 Hz) the temperatures of ε' and ε' maxima follow the Vogel-Fulcher law and the entire ε" data set can be scaled using a scaling variable related to frequency by the Vogel-Fulcher law. At f > 106 Hz the Vogel-Fulcher law and scaling are also valid, but with different fitting parameters. The results can be described in terms of a phenomenological model implying a wide and smooth spectrum of relaxation times which broadens with decreasing temperature rather than be explained by freezing into the glass state.

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<title xml:lang="en" level="a">Dielectric spectra and Vogel-Fulcher scaling in Pb(In
<sub>0.5</sub>
Nb
<sub>0.5</sub>
)O
<sub>3</sub>
relaxor ferroelectric</title>
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<name sortKey="Bokov, A A" uniqKey="Bokov A">A. A. Bokov</name>
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<s1>Microelectronics Department, Kiev Polytechnic Institute, 37 Pobedi Avenue</s1>
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<name sortKey="Raevski, I P" uniqKey="Raevski I">I. P. Raevski</name>
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<term>Dielectric dispersion</term>
<term>Dielectric relaxation</term>
<term>Disordered systems</term>
<term>Experimental study</term>
<term>Ferroelectric materials</term>
<term>Frequency dependence</term>
<term>Glass structure</term>
<term>Indium oxides</term>
<term>Lead oxides</term>
<term>Niobium oxides</term>
<term>Permittivity</term>
<term>Phenomenological model</term>
<term>Property structure relationship</term>
<term>Quaternary compounds</term>
<term>Relaxation time</term>
<term>Relaxor</term>
<term>Temperature dependence</term>
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<keywords scheme="Pascal" xml:lang="fr">
<term>Dispersion diélectrique</term>
<term>Dépendance fréquence</term>
<term>Constante diélectrique</term>
<term>Modèle phénoménologique</term>
<term>Relaxation diélectrique</term>
<term>Temps relaxation</term>
<term>Dépendance température</term>
<term>Système désordonné</term>
<term>Structure verre</term>
<term>Relation structure propriété</term>
<term>Relaxeur</term>
<term>Matériau ferroélectrique</term>
<term>Plomb oxyde</term>
<term>Indium oxyde</term>
<term>Niobium oxyde</term>
<term>Etude expérimentale</term>
<term>Composé quaternaire</term>
<term>7722G</term>
<term>Pb(In0,5Nb0,5)O3</term>
<term>In Nb O Pb</term>
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<div type="abstract" xml:lang="en">Dielectric dispersion in disordered Pb(In
<sub>0.5</sub>
Nb
<sub>0.5</sub>
)O
<sub>3</sub>
crystals was studied. Two dispersion regions were found at 10
<sup>3</sup>
-10
<sup>5</sup>
Hz and 10
<sup>8</sup>
-10
<sup>9</sup>
Hz at room temperature. The low-frequency relaxation process, which has a very wide distribution of relaxation times, shifts to higher frequency (up to about 10
<sup>9</sup>
Hz) and becomes narrower in frequency with increasing temperature. It is this relaxation process that is responsible for the temperature shift of the diffused ε(T) maximum with increasing frequency. At low frequencies (f < 10
<sup>6</sup>
Hz) the temperatures of ε' and ε' maxima follow the Vogel-Fulcher law and the entire ε" data set can be scaled using a scaling variable related to frequency by the Vogel-Fulcher law. At f > 10
<sup>6</sup>
Hz the Vogel-Fulcher law and scaling are also valid, but with different fitting parameters. The results can be described in terms of a phenomenological model implying a wide and smooth spectrum of relaxation times which broadens with decreasing temperature rather than be explained by freezing into the glass state.</div>
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<s0>Dielectric dispersion in disordered Pb(In
<sub>0.5</sub>
Nb
<sub>0.5</sub>
)O
<sub>3</sub>
crystals was studied. Two dispersion regions were found at 10
<sup>3</sup>
-10
<sup>5</sup>
Hz and 10
<sup>8</sup>
-10
<sup>9</sup>
Hz at room temperature. The low-frequency relaxation process, which has a very wide distribution of relaxation times, shifts to higher frequency (up to about 10
<sup>9</sup>
Hz) and becomes narrower in frequency with increasing temperature. It is this relaxation process that is responsible for the temperature shift of the diffused ε(T) maximum with increasing frequency. At low frequencies (f < 10
<sup>6</sup>
Hz) the temperatures of ε' and ε' maxima follow the Vogel-Fulcher law and the entire ε" data set can be scaled using a scaling variable related to frequency by the Vogel-Fulcher law. At f > 10
<sup>6</sup>
Hz the Vogel-Fulcher law and scaling are also valid, but with different fitting parameters. The results can be described in terms of a phenomenological model implying a wide and smooth spectrum of relaxation times which broadens with decreasing temperature rather than be explained by freezing into the glass state.</s0>
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